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Probe type Tunable Diode Laser Spectrometer TDLS8200
  • Probe type Tunable Diode Laser Spectrometer TDLS8200
  • Probe type Tunable Diode Laser Spectrometer TDLS8200

Probe type Tunable Diode Laser Spectrometer TDLS8200

Yokogawa’s new TDLS8200 continues to house all of the industry’s leading features from the TDLS8000, but now only requiring a single-flange installation. An in-situ measurement with a probe still removes the requirement for sample extraction and conditioning and can be used in variety of aggressive process conditions.

The 0.5 meter measurement area of the probe provides some averaging improvement compared with traditional point-sensor technologies, and has flexible positioning of that measurement area with different insertion lengths being offered.


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Yokogawa’s new TDLS8200 continues to house all of the industry’s leading features from the TDLS8000, but now only requiring a single-flange installation. An in-situ measurement with a probe still removes the requirement for sample extraction and conditioning and can be used in variety of aggressive process conditions.

The 0.5 meter measurement area of the probe provides some averaging improvement compared with traditional point-sensor technologies, and has flexible positioning of that measurement area with different insertion lengths being offered.


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